Michael Gehm

Michael Gehm is a Professor of Electrical and Computer Engineering and a Professor of Physics at Duke University, where he also serves as Director of Graduate Studies in the Department of Electrical and Computer Engineering. His research focuses on computational and compressive sensing and measurement across various modalities, with particular emphasis on electromagnetic and optical systems ranging from RF to x-ray and mass spectrometry. He holds a B.S. in Mechanical Engineering from Washington University in St. Louis and earned his A.M. and Ph.D. degrees in Physics from Duke University. His work includes contributions to optical physics, high-performance x-ray simulation, and rapid-prototyping for advanced electromagnetic structures. He is a Fellow of Optica and SPIE.

Michael Gehm is a Professor of Electrical and Computer Engineering and Physics at Duke University. His research focuses on computational sensing, computational imaging, compressive sensing, mass spectrometry, and x-ray imaging. His work explores advanced imaging techniques, including single-shot compressive spectral imaging, multiscale gigapixel photography, and compressive imaging spectrometers using coded apertures. He also investigates the dynamics of noise-induced heating in atom traps and the mechanical stability of strongly interacting Fermi gases. His research integrates experimental and theoretical approaches to develop novel sensing and imaging technologies with applications in physics and engineering.