Atomic Force Microscopy

Atomic Force Microscopy is a research facility located in the School of Chemistry at The University of Edinburgh. It specializes in scanning probe microscopy techniques, including atomic force microscopy (AFM), which provides high-resolution surface topography analysis at the nanoscale. The facility supports a range of applications, such as semiconductor wafers, biomaterials, and magnetic media. It offers services like AFM surface topography measurements, magnetic force microscopy, and force spectroscopy experiments. The facility also provides training and access to instruments with real-time expert support.